Optical Grade LiNbO₃ Wafer

Parameter	Specification
Material	Optical Grade LiNbO3 Wafers (White or Black)
Diameter	2inch/3inch/4inch
Diameter Tolerance	±0.03mm
Curie Temp	1142±0.2℃
Cutting Angle	X/Y/Z etc.
Tol(±)	<0.20 mm   ±0.005mm
Thickness	0.18 ~ 0.5mm or more
Primary Flat	16mm/22mm /32mm
TTV	<3µm
BOW	-30
WARP	<40µm
Orientation Flat	All available
Surface Type	Single Side Polished(SSP) /Double Sides   Polished(DSP)
Polished side Ra	<0.5nm
S/D	20/10
Edge Criteria	R=0.2mm C-type or Bullnose
Quality	Free of crack (bubbles and inclusions)
Optical doped	Mg/Fe/Zn/MgO etc. for optical grade
Wafer Surface Criteria	Refractive index     No=2.2878/Ne=2.2033 @632nm wavelength
	Contamination      None
	Particles @>0.3 µm  ≤30
	Scratch , Chipping   None
	Defect              No edge cracks, scratches, saw marks, stains
Packing	25pcs per box

SAW Grade Lithium Niobate Wafers

Parameter	Specification
Material	LiNbO3 wafers (White or Black)
Diameter	3inch/4inch/inch LN wafer & 8inch under R/D
Diameter Tolerance	±0.03mm
Curie Temp	1142±2.0℃
Cutting Angle	X/Y/Z/Y36/Y41/Y64/Y128/etc.
Tol(±)	<0.20 mm
Thickness	0.18 ~ 0.5mm or more
Primary Flat	22mm /32mm /42.5mm /57.5mm
LTV (5mmx5mm)	<1µm
TTV	<3µm
BOW	-30
WARP	<40µm
PLTV(<0.5um)	≥95%(5mm*5mm)
Orientation Flat	All available
Surface Type	Single Side Polished(SSP) /Double Sides Polished(DSP)
Polished side Ra	<0.5nm
Back Side Criteria	General is 0.2-0.5µm or as customized
Edge Criteria	R=0.2mm or Bullnose
Wafer Surface Criteria	Transmissivity       general:5.9x10-11-10 at 25℃
	Contamination       None
	Particles @>0.3 µm  ≤30
	Scratch , Chipping   None
	Defect              No edge cracks, scratches, saw marks, stains
Packing	25pcs per box

Optical grade LiNbO3 wafers SLN CLN

Parameter	Specification
Material	Optical Grade LiNbO3 Wafers (White or Black)
Diameter	2inch/3inch/4inch
Diameter Tolerance	±0.03mm
Curie Temp	1142±0.7℃
Cutting Angle	X/Y/Z etc.
Tol(±)	<0.20 mm   ±0.005mm
Thickness	0.18 ~ 0.5mm or more
Primary Flat	16mm/22mm /32mm
TTV	<3µm
BOW	-30
WARP	<40µm
Orientation Flat	All available
Surface Type	Single Side Polished(SSP) /Double Sides   Polished(DSP)
Polished side Ra	<0.5nm
S/D	20/10
Edge Criteria	R=0.2mm C-type or Bullnose
Quality	Free of crack (bubbles and inclusions)
Optical doped	Mg/Fe/Zn/MgO etc. for optical grade   LN< wafers per requested
Wafer Surface Criteria	Refractive index     No=2.2878/Ne=2.2033 @632nm wavelength/prism   coupler method.
	Contamination      None
	Particles @>0.3 µm  ≤30
	Scratch , Chipping   None
	Defect              No edge cracks, scratches, saw marks, stains
Packing	25pcs per box